DocumentCode
2970932
Title
On adaptive diagnostic test generation
Author
Gong, Y. ; Chakravarty, S.
Author_Institution
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
fYear
1995
fDate
5-9 Nov. 1995
Firstpage
181
Lastpage
184
Abstract
Adaptive diagnosis, a paradigm for diagnosis, is defined. A system based on this paradigm, for I/sub DDQ/ measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the system shows it to be substantially superior to existing systems, especially for larger circuits.
Keywords
logic design; logic testing; I/sub DDQ/ measurement based diagnosis; adaptive diagnostic test generation; bridging faults; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer science; Dictionaries; Electrical fault detection; Fabrication; Fault diagnosis; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-8186-8200-0
Type
conf
DOI
10.1109/ICCAD.1995.480010
Filename
480010
Link To Document