DocumentCode
2970945
Title
Non-volatile memory special interest group discussion notes
Author
Paulsen, Ron
Author_Institution
Motorola Semiconductor Products Sector
fYear
2000
fDate
2000
Firstpage
193
Lastpage
193
Keywords
Cellular phones; Educational institutions; Industrial electronics; Nonvolatile memory; Physics; Plasma temperature; Semiconductor device reliability; Silicon carbide; Space technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 2000 IEEE International
Print_ISBN
0-7803-6392-2
Type
conf
DOI
10.1109/IRWS.2000.911940
Filename
911940
Link To Document