DocumentCode :
2970945
Title :
Non-volatile memory special interest group discussion notes
Author :
Paulsen, Ron
Author_Institution :
Motorola Semiconductor Products Sector
fYear :
2000
fDate :
2000
Firstpage :
193
Lastpage :
193
Keywords :
Cellular phones; Educational institutions; Industrial electronics; Nonvolatile memory; Physics; Plasma temperature; Semiconductor device reliability; Silicon carbide; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2000 IEEE International
Print_ISBN :
0-7803-6392-2
Type :
conf
DOI :
10.1109/IRWS.2000.911940
Filename :
911940
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2970945
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