• DocumentCode
    2971030
  • Title

    High-reliability epoxy molding compound for surface-mounted devices

  • Author

    Kuroki, S. ; Oota, K.

  • Author_Institution
    Sumitomo Bakelite Co. Ltd., Tochigi, Japan
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    885
  • Lastpage
    890
  • Abstract
    Surface-mount packages are subjected to high levels of thermal stress in mounting, which causes package cracking or lowering of the humidity resistance after mounting. These modes of deterioration are studied experimentally and theoretically by considering the stress characteristics of molding compounds at high temperatures. The study indicated that both low stress and high strength of molding compounds at high temperature are significant causes of quality deterioration in mounting. The characteristics required of molding compounds to cope with surface-mounting methods are given
  • Keywords
    circuit reliability; packaging; polymers; printed circuit manufacture; reliability; soldering; stress analysis; surface mount technology; thermal stresses; PCB manufacture; SMD mounting; cracking; epoxy molding compound; high temperatures; humidity resistance reduction; packages; quality deterioration; soldering; stress analysis; surface-mounted devices; thermal stress; Electronic packaging thermal management; Humidity; Resins; Soldering; Surface cracks; Surface resistance; Temperature; Thermal resistance; Thermal stresses; Water storage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77850
  • Filename
    77850