Title :
SUBTRACT: a program for the efficient evaluation of substrate parasitics in integrated circuits
Author :
Verghese, N.K. ; Allstot, D.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Algorithms for the efficient evaluation of substrate parasitics in mixed-signal integrated circuits have been developed and incorporated in an extraction tool for substrate parasitics, SUBTRACT. Using a preprocessed, polynomial-based boundary element method, SUBTRACT enables the parasitic extraction process to be completely technology independent, allowing for fast evaluation. Additionally, techniques to accelerate the iterative solution of the resulting impedance matrix have been developed and employed to further improve the speed advantages that this method offers. The preprocessed boundary element method is more efficient than finite-difference schemes and orders of magnitude faster than general boundary element methods using a direct evaluation of Green´s function. Results of employing SUBTRACT to the design and verification of a mixed-signal A/D converter IC are described.
Keywords :
Green´s function methods; analogue-digital conversion; boundary-elements methods; circuit CAD; electric impedance; formal verification; iterative methods; mixed analogue-digital integrated circuits; polynomials; video signal processing; Green´s function; SUBTRACT program; algorithms; efficient substrate parasitics evaluation; extraction tool; impedance matrix; iterative solution; mixed-signal A/D converter integrated circuit design; mixed-signal A/D converter integrated circuit verification; mixed-signal integrated circuits; preprocessed polynomial-based boundary element method; speed advantages; technology independent process; Boundary element methods; Coupling circuits; Finite difference methods; Integrated circuit technology; Iterative methods; Mixed analog digital integrated circuits; Monolithic integrated circuits; Polynomials; Substrates; Surface impedance;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.480012