Title :
Efficient coupled noise estimation for RLC on-chip interconnect
Author :
Maheshwari, Vikas ; Gupta, Shruti ; Khare, Kapil ; Yadav, Vimal ; Kar, Rajib ; Mandal, Durbadal ; Bhattacharjee, Anup Kr
Author_Institution :
Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol. Durgapur, Durgapur, India
Abstract :
This paper presents an accurate, fast and simple closed form solution to estimate crosstalk noise between two adjacent wires in VLSI circuits, using RLC interconnect model. Noise analysis and avoidance techniques are critical steps in deep submicron VLSI technology. Currently noise analysis performed either through circuit or timing simulation. These techniques are still inefficient for analyzing massive amount of interconnect data found in present day integrated circuit. This paper presents an efficient technique for estimation of coupled noise in on-chip VLSI interconnects. This noise estimation metric is an upper bound for RLC circuit, being similar in spirit to Elmore delay in timing analysis. Such an efficient noise metric is required especially for noise and physical design based noise avoidance techniques.
Keywords :
VLSI; Elmore delay; RLC on-chip interconnect; VLSI circuits; crosstalk noise estimation metric; efficient coupled noise estimation; physical design based noise avoidance techniques; timing simulation; Computational modeling; Crosstalk; Integrated circuit interconnections; Integrated circuit modeling; Measurement; Noise; RLC circuits; Coupling; Crosstalk Noise Calculation; RLC interconnects; VLSI;
Conference_Titel :
Humanities, Science and Engineering Research (SHUSER), 2012 IEEE Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4673-1311-7
DOI :
10.1109/SHUSER.2012.6268792