Measurement and characterization of cell loss in ATM switches

Focuses on the measurement of cell loss process, mainly the cell loss ratio (CLR) and the cell loss inter occurrence time, of ATM switches and the statistical interpretation of the observational data. The measurement data shows that the process of the occurrence of cell loss is of type GI, but not Poisson. Furthermore, the data shows that the measurement results, obtained under rather heavy load, can be used for an accurate extrapolation of the CLR at a lower load. The traffic descriptor that has been used to generate the load guarantees worst-case CLR. To summarize, the paper presents a framework for accelerated and accurate measurement of the worst case CLR under various load conditions