DocumentCode :
297195
Title :
Performance and Reliability of BASS Devices
Author :
Herman, M.H. ; Mansfield, D. ; Ahern, S.M. ; Positeri, K.M. ; Ragle, L.O. ; Falk, R.A.
Volume :
1
fYear :
1993
fDate :
21-23 June 1993
Firstpage :
68
Keywords :
Hazards; Optical pulses; Power semiconductor switches; Power system reliability; Pulse circuits; Reliability theory; Semiconductor device reliability; Semiconductor device testing; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1993. Digest of Technical Papers., Ninth IEEE International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-1415-8
Type :
conf
DOI :
10.1109/PPC.1993.512878
Filename :
512878
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=297195
