DocumentCode :
2972223
Title :
The Development of Multifunctional Intellectual Electrical Parameters Test Instrument
Author :
Yang, Zhifang
Author_Institution :
Wuhan Inst. of Technol., Wuhan
fYear :
2008
fDate :
2-3 Aug. 2008
Firstpage :
328
Lastpage :
331
Abstract :
This article presents a test method of multifunctional electrical parameters by adopting 80C196KC single chip microcomputer as the intellectual part. The features of this design are: the hardware guarantees the measurement accuracy of forward analog channel by using data processing program in order to accomplish each electrical parameter algorithm. All the practices demonstrate this method is reliable and accurate in the on-line measurement of electrical parameters.
Keywords :
electric variables measurement; microprocessor chips; test equipment; 80C196KC single chip microcomputer; data processing program; forward analog channel; multifunctional intellectual electrical parameters test instrument; on-line measurement; Current measurement; Distortion measurement; Electric variables measurement; Electronic equipment testing; Frequency measurement; Instruments; Power system harmonics; Sampling methods; Semiconductor device measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Intelligent Transportation System, 2008. PEITS '08. Workshop on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3342-1
Type :
conf
DOI :
10.1109/PEITS.2008.129
Filename :
4634870
Link To Document :
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