DocumentCode
2972223
Title
The Development of Multifunctional Intellectual Electrical Parameters Test Instrument
Author
Yang, Zhifang
Author_Institution
Wuhan Inst. of Technol., Wuhan
fYear
2008
fDate
2-3 Aug. 2008
Firstpage
328
Lastpage
331
Abstract
This article presents a test method of multifunctional electrical parameters by adopting 80C196KC single chip microcomputer as the intellectual part. The features of this design are: the hardware guarantees the measurement accuracy of forward analog channel by using data processing program in order to accomplish each electrical parameter algorithm. All the practices demonstrate this method is reliable and accurate in the on-line measurement of electrical parameters.
Keywords
electric variables measurement; microprocessor chips; test equipment; 80C196KC single chip microcomputer; data processing program; forward analog channel; multifunctional intellectual electrical parameters test instrument; on-line measurement; Current measurement; Distortion measurement; Electric variables measurement; Electronic equipment testing; Frequency measurement; Instruments; Power system harmonics; Sampling methods; Semiconductor device measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Intelligent Transportation System, 2008. PEITS '08. Workshop on
Conference_Location
Guangzhou
Print_ISBN
978-0-7695-3342-1
Type
conf
DOI
10.1109/PEITS.2008.129
Filename
4634870
Link To Document