DocumentCode :
2972252
Title :
US-PCS SAW duplexer using high-Q SAW resonator with SiO2 coat for stabilizing temperature characteristics
Author :
Takayama, R. ; Nakanishi, H. ; Iwasaki, Y. ; Sakuragawa, T. ; Fujii, K.
Author_Institution :
Matsushita Electron. Components Co. Ltd., Osaka, Japan
Volume :
2
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
959
Abstract :
We have successfully developed SAW resonators with a SiO2 coat, which have both high-Q characteristics and stable temperature characteristics. We realized a SAW duplexer for the US PCS band (US-PCS) using these resonators. The frequency characteristics variation due to temperature change is usually taken into design consideration. However, in case of the US-PCS duplexer, which has a difficult frequency allocation for the transmission (Tx) band and the reception (Rx) band. A temperature coefficient (TC) reduction technology is essential to realize the US-PCS SAW duplexer. Of course, this TC reduction technique should not deteriorate the filter characteristics, such as insertion loss. In this report, we explain the TC reduction technique using a SiO2 layer and the US-PCS SAW duplexer employing these resonators. It shows good performance over the temperature range -30°C to +85°C.
Keywords :
Q-factor; UHF filters; silicon compounds; surface acoustic wave resonator filters; thermal stability; -30 to 85 degC; SAW duplexer; SiO2-LiTaO3; US PCS band; high-Q SAW resonator; insertion loss; temperature coefficient reduction; temperature stabilization; Insertion loss; Optical resonators; Q factor; Resonant frequency; Resonator filters; SAW filters; Surface acoustic wave devices; Surface acoustic waves; Temperature distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-8412-1
Type :
conf
DOI :
10.1109/ULTSYM.2004.1417918
Filename :
1417918
Link To Document :
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