DocumentCode :
2973032
Title :
Frequency Deviation Due to a Sample Insertion Hole in a Cylindrical Cavity by Circuital Analysis
Author :
Penaranda-Foix, Felipe L. ; Catala-Civera, Jose M. ; Canos-Marin, Antoni J. ; Garcia-Banos, Beatriz
Author_Institution :
Tech. Univ. of Valencia, Valencia
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
1683
Lastpage :
1686
Abstract :
One of the most widely used techniques for dielectric material characterization is the partially filled circular cavity. The exact analysis of this structure is well known in the bibliography. But in practice when the measured material is introduced through a circular pipe below its cut off frequency a problem arises. Traditionally the tube effect is neglected, but then some errors appear, whose magnitude depends on the material properties and the cavity and tube dimensions. In some cases, the errors introduced are noticeable and the tube effect should not be neglected. Some authors have tried to evaluate in a simple way this effect, but their equations are valid only in a restricted range of practical configurations. In this paper we present a model of this effect based on a circuital analysis of the full structure. A simple monomode equation valid for any material property and cavity dimensions is given and a saturation effect, not reported before, is analyzed.
Keywords :
cavity resonators; dielectric materials; network analysis; cavity dimensions; circuit analysis; circular pipe; cylindrical cavity; dielectric material characterization; frequency deviation; material properties; partially filled circular cavity; sample insertion hole; simple monomode equation; tube effect; Bibliographies; Cavity perturbation methods; Cavity resonators; Circuit analysis; Dielectric materials; Dielectric measurements; Equations; Frequency measurement; Material properties; Mode matching methods; Cavity perturbation methods; Cavity resonators; Circuit analysis; Mode matching methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380030
Filename :
4264174
Link To Document :
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