• DocumentCode
    2973102
  • Title

    Texturing of polycrystalline silicon [solar cells]

  • Author

    Stocks, M.J. ; Carr, A.J. ; Blakers, A.W.

  • Author_Institution
    Dept. of Eng., Australian Nat. Univ., Canberra, ACT, Australia
  • Volume
    2
  • fYear
    1994
  • fDate
    5-9 Dec 1994
  • Firstpage
    1551
  • Abstract
    A simple texturing procedure suitable for polycrystalline solar cells is described that matches the performance of anisotropic etching on single crystal wafers. Single crystal wafers are typically etched with anisotropic etches relying on knowledge of crystal orientation not possible with the random grain orientation in polycrystalline silicon. Solar cells are encapsulated before field deployment and with suitable surface texturing, total internal reflection from the air/glass interface is used to minimize reflection losses. A wet chemical isotropic etch is used to produce surface texturing, with moderate to large inclination relative to the original wafer surface. Reflection measurements from encapsulated samples show reflection losses after the isotropic etch are comparable with those from inverted pyramids or microgrooves. The isotropic etch has superior light trapping properties, important in thin cells produced by epitaxy and other techniques
  • Keywords
    elemental semiconductors; encapsulation; etching; semiconductor device testing; silicon; solar cells; surface texture; Si; crystal wafers; encapsulation; light trapping properties; polycrystalline semiconductor; reflection losses; reflection measurements; solar cell; texturing procedure; total internal reflection; wet chemical isotropic etch; Anisotropic magnetoresistance; Chemicals; Epitaxial growth; Glass; Loss measurement; Optical reflection; Photovoltaic cells; Silicon; Surface texture; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    0-7803-1460-3
  • Type

    conf

  • DOI
    10.1109/WCPEC.1994.520510
  • Filename
    520510