DocumentCode
2973222
Title
Bayes Reliability Assessment for Micro-accelerometer Based on Failure Statistical Model
Author
Peng-bin, Zhou ; Xi-hong, Ma
Author_Institution
Nat. Key Lab. For Electron. Meas. Technol., North Univ. of China, Taiyuan, China
fYear
2010
fDate
25-27 June 2010
Firstpage
536
Lastpage
539
Abstract
Foundation on the characteristics of long life and high reliability products, on the condition of const failure mechanism. Reliability Assessment based on failure statistical model is proposed. Firstly, the distribution function of system life is deduced based on order statistics theory and the second maximum likelihood estimation for the parameters in the model are proposed. Steps to assess the system reliability are given. Examples illustrate the feasibility of the method.
Keywords
Bayes methods; accelerometers; failure analysis; microsensors; reliability; Bayes reliability assessment; failure statistical model; micro accelerometer; Accelerometers; Analytical models; Data models; Maximum likelihood estimation; Reliability engineering; Testing; Bayes; micro-accelerometer; order statistics; reliability evaluation; the second maximum likelihood estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6880-5
Type
conf
DOI
10.1109/iCECE.2010.138
Filename
5629531
Link To Document