Title :
Bayes Reliability Assessment for Micro-accelerometer Based on Failure Statistical Model
Author :
Peng-bin, Zhou ; Xi-hong, Ma
Author_Institution :
Nat. Key Lab. For Electron. Meas. Technol., North Univ. of China, Taiyuan, China
Abstract :
Foundation on the characteristics of long life and high reliability products, on the condition of const failure mechanism. Reliability Assessment based on failure statistical model is proposed. Firstly, the distribution function of system life is deduced based on order statistics theory and the second maximum likelihood estimation for the parameters in the model are proposed. Steps to assess the system reliability are given. Examples illustrate the feasibility of the method.
Keywords :
Bayes methods; accelerometers; failure analysis; microsensors; reliability; Bayes reliability assessment; failure statistical model; micro accelerometer; Accelerometers; Analytical models; Data models; Maximum likelihood estimation; Reliability engineering; Testing; Bayes; micro-accelerometer; order statistics; reliability evaluation; the second maximum likelihood estimation;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.138
