DocumentCode
2973397
Title
Hydrophilic of SiO2 /TiO2 double layers thin film prepared by sol-gel dip coating method
Author
Fadzeelah, A.K.N. ; Ramli, Muhammad Zahiruddin ; Amri, Nurulhuda ; Maarof, H.I.
Author_Institution
Fac. of Chem. Eng., UiTM Cawangan Pulau Pinang, Permatang Pauh, Malaysia
fYear
2012
fDate
24-27 June 2012
Firstpage
53
Lastpage
57
Abstract
In this study, TiO2, SiO2 and SiO2/TiO2 double layers thin films were prepared and coated on the glass plate via sol-gel dip coating method. The samples were characterized using X-Ray Diffraction (XRD) and Fourier Transform Infrared (FTIR) to analyze the present of TiO2 and SiO2 compounds in the prepared samples. Meanwhile, UV-Vis spectrophotometer was used to measure the transmittance spectra of the thin films and the water contact angle was analyzed to determine the hydrophilic properties. XRD result revealed that the TiO2 xerogel was anatase phase after the calcination. As for SiO2 xerogel, the pattern of IR spectra demonstrated the formation of SiO2 network. Therefore, from these results, the TiO2 and SiO2 xerogels were successfully prepared. Besides that, surface morphology of prepared coating films were studied using Scanning Electron Microscopy (SEM). As expected for SiO2/TiO2 double layers thin film, SiO2 particles aggregates were randomly distributed on the surface of TiO2. Performance wise, the prepared coating samples were also shown a positive result of water contact angle analyses. This finding revealed that a SiO2/TiO2 double layers thin film has demonstrated hydrophilic property based on the 13.9° of contact angle achieved. Moreover, the light transmittance of this thin film at normally incident light can be reached up to 70%. Therefore, it can be summarized that SiO2/TiO2 double layers thin film demonstrated a hydrophilic surface in nature.
Keywords
Fourier transform spectra; X-ray diffraction; aerogels; aggregates (materials); contact angle; dip coating; hydrophilicity; infrared spectra; scanning electron microscopy; semiconductor materials; silicon compounds; sol-gel processing; spectrophotometry; surface morphology; thin films; ultraviolet spectra; visible spectra; FTIR spectra; Fourier transform infrared spectra; SEM; SiO2-TiO2; UV-visible spectrophotometry; X-ray diffraction; XRD; anatase phase; glass plate; hydrophilic double-layer thin films; light transmittance spectra; particle aggregates; scanning electron microscopy; sol-gel dip coating; surface morphology; water contact angle; xerogel; Automotive engineering; Coatings; Films; Glass; Surface morphology; Surface treatment; Hydrophilic; SiO2 /TiO2 double layers of thin film; Sol-gel dip coating; Water contact angle;
fLanguage
English
Publisher
ieee
Conference_Titel
Humanities, Science and Engineering Research (SHUSER), 2012 IEEE Symposium on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4673-1311-7
Type
conf
DOI
10.1109/SHUSER.2012.6268887
Filename
6268887
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