• DocumentCode
    2974419
  • Title

    On-Chip Interconnects Modeling in Time-Domain using the Explicit DuFort-Frankel Algorithm

  • Author

    Matthaiou, M. ; Konstantinou, K. ; Yioultsis, T.V.

  • Author_Institution
    Aristotle Univ. of Thessaloniki, Thessaloniki
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1963
  • Lastpage
    1966
  • Abstract
    In this paper, a tractable time domain scheme is proposed for the effective modeling of microwave planar structures. Our study relies on the DuFort-Frankel algorithm (DF) which is in principle an alternative of the conventional finite-difference time-domain (FDTD) technique but yields unconditionally stable estimates and is more accurate. We focus on the integrated stripline circuits since they are less susceptible to radiation and dispersion effects compared to microstrips. A quasi-static approximation was adopted and a comprehensive field characterization is achieved by discretizing the time and space into cells and thereafter applying the Maxwell´s equations and boundary conditions. Finally, the frequency dependent circuit parameters, namely the per-unit length (p.u.l) resistance and conductance, were estimated using the fundamental laws of electromagnetism.
  • Keywords
    Maxwell equations; electromagnetism; integrated circuit interconnections; strip line circuits; time-domain analysis; Maxwell´s equation; boundary condition; comprehensive field characterization; electromagnetism; explicit DuFort-frankel algorithm; integrated stripline circuits; microwave planar structure modeling; on-chip interconnect modeling; quasistatic approximation; tractable time domain scheme; Boundary conditions; Dispersion; Finite difference methods; Integrated circuit interconnections; Integrated circuit yield; Maxwell equations; Microstrip; Stripline; Time domain analysis; Yield estimation; FDTD methods; eddy currents; numerical analysis; stripline circuits; transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380196
  • Filename
    4264249