Title :
Accuracy of micro four-point probe measurements on inhomogeneous samples: A probe spacing dependence study
Author :
Wang, Fei ; Petersen, Dirch H. ; Osterberg, Frederik W. ; Hansen, Ole
Author_Institution :
Dept. of Micro- & Nanotechnol., Tech. Univ. of Denmark, Lyngby, Denmark
fDate :
Sept. 29 2009-Oct. 2 2009
Abstract :
In this paper, we discuss a probe spacing dependence study in order to estimate the accuracy of micro four-point probe measurements on inhomogeneous samples. Based on sensitivity calculations, both sheet resistance and Hall effect measurements are studied for samples (e.g. laser annealed samples) with periodic variations of sheet resistance, sheet carrier density, and carrier mobility. With a variation wavelength of ¿, probe spacings from 0.0012 to 1002 have been applied to characterize the local variations. The calculations show that the measurement error is highly dependent on the probe spacing. When the probe spacing is smaller than 1/40 of the variation wavelength, micro four-point probes can provide an accurate record of local properties with less than 1% measurement error. All the calculations agree well with previous experimental results.
Keywords :
Hall effect; carrier mobility; electron probes; inhomogeneous media; laser beam annealing; measurement errors; Hall effect measurements; carrier mobility; inhomogeneous samples; laser annealed samples; measurement error; microfour-point probe measurements; probe spacing dependence; sheet carrier density; sheet resistance; Annealing; Area measurement; Charge carrier density; Density measurement; Electrical resistance measurement; Hall effect; Measurement errors; Probes; Semiconductor laser arrays; Wavelength measurement;
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2009. RTP '09. 17th International Conference on
Conference_Location :
Albany, NY
Print_ISBN :
978-1-4244-3814-3
Electronic_ISBN :
1944-0251
DOI :
10.1109/RTP.2009.5373449