• DocumentCode
    2975019
  • Title

    Quality technology for the factory floor

  • Author

    Donahue, Michael

  • Author_Institution
    Sheffield Meas., Dayton, OH, USA
  • fYear
    1989
  • fDate
    22-26 May 1989
  • Firstpage
    1522
  • Abstract
    It is noted that manufacturing demands for higher quality and increased productivity are changing the role of dimensional inspection. Verification techniques that catch defects only after parts have been made are no longer acceptable. This shift in emphasis from detection to prevention is taking inspection out of the quality-assurance lab and placing it on the manufacturing floor to provide timely feedback for process control and correction. Automatic inspection systems, based on the coordinate measuring machine, are being designed for this new role. The various elements of these flexible inspection systems (FISs) that are emerging as shop-floor companions to flexible manufacturing systems are examined. The ways in which FIS systems serve in-process dimensional inspection needs, including data-processing requirements for providing real-time feedback to manufacturing processes, are described. Development areas holding potential for increasing the reliability, throughput, application range, and versatility of FIS systems in automated manufacturing are discussed
  • Keywords
    flexible manufacturing systems; inspection; quality control; FIS systems; automated manufacturing; automatic inspection system; coordinate measuring machine; data-processing requirements; dimensional inspection; flexible inspection systems; flexible manufacturing systems; process control; quality-assurance; real-time feedback; reliability; verification techniques; Coordinate measuring machines; Feedback; Flexible manufacturing systems; Inspection; Manufacturing processes; Process control; Production facilities; Productivity; Real time systems; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1989.40417
  • Filename
    40417