DocumentCode :
2975314
Title :
Defect distribution for wearable system design
Author :
Dorsey, John G. ; Siewiorek, Daniel P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2002
fDate :
2002
Firstpage :
135
Lastpage :
136
Abstract :
This paper describes a design process for custom wearable systems produced in an academic setting. A set of 245 wearable design defects from two distinct periods separated by six years in time is presented. These data identify aspects of the process requiring significant developer effort, which we show using an orthogonal defect classification scheme. A comparison of defect attribute distributions across the two separate design periods is given. The results show that growing electronic complexity is increasing the number of defects caused by designer error, and that more defects are being observed in earlier phases of the design process.
Keywords :
DP industry; social aspects of automation; wearable computers; defect attribute distributions; defect distribution; electronic complexity; orthogonal defect classification scheme; wearable system design; Fabrication; Hardware; Manufacturing; Moore´s Law; Operating systems; Process design; Software design; Testing; Usability; Wearable computers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wearable Computers, 2002. (ISWC 2002). Proceedings. Sixth International Symposium on
ISSN :
1530-0811
Print_ISBN :
0-7695-1816-8
Type :
conf
DOI :
10.1109/ISWC.2002.1167231
Filename :
1167231
Link To Document :
بازگشت