• DocumentCode
    2975314
  • Title

    Defect distribution for wearable system design

  • Author

    Dorsey, John G. ; Siewiorek, Daniel P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    135
  • Lastpage
    136
  • Abstract
    This paper describes a design process for custom wearable systems produced in an academic setting. A set of 245 wearable design defects from two distinct periods separated by six years in time is presented. These data identify aspects of the process requiring significant developer effort, which we show using an orthogonal defect classification scheme. A comparison of defect attribute distributions across the two separate design periods is given. The results show that growing electronic complexity is increasing the number of defects caused by designer error, and that more defects are being observed in earlier phases of the design process.
  • Keywords
    DP industry; social aspects of automation; wearable computers; defect attribute distributions; defect distribution; electronic complexity; orthogonal defect classification scheme; wearable system design; Fabrication; Hardware; Manufacturing; Moore´s Law; Operating systems; Process design; Software design; Testing; Usability; Wearable computers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wearable Computers, 2002. (ISWC 2002). Proceedings. Sixth International Symposium on
  • ISSN
    1530-0811
  • Print_ISBN
    0-7695-1816-8
  • Type

    conf

  • DOI
    10.1109/ISWC.2002.1167231
  • Filename
    1167231