DocumentCode
2975314
Title
Defect distribution for wearable system design
Author
Dorsey, John G. ; Siewiorek, Daniel P.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2002
fDate
2002
Firstpage
135
Lastpage
136
Abstract
This paper describes a design process for custom wearable systems produced in an academic setting. A set of 245 wearable design defects from two distinct periods separated by six years in time is presented. These data identify aspects of the process requiring significant developer effort, which we show using an orthogonal defect classification scheme. A comparison of defect attribute distributions across the two separate design periods is given. The results show that growing electronic complexity is increasing the number of defects caused by designer error, and that more defects are being observed in earlier phases of the design process.
Keywords
DP industry; social aspects of automation; wearable computers; defect attribute distributions; defect distribution; electronic complexity; orthogonal defect classification scheme; wearable system design; Fabrication; Hardware; Manufacturing; Moore´s Law; Operating systems; Process design; Software design; Testing; Usability; Wearable computers;
fLanguage
English
Publisher
ieee
Conference_Titel
Wearable Computers, 2002. (ISWC 2002). Proceedings. Sixth International Symposium on
ISSN
1530-0811
Print_ISBN
0-7695-1816-8
Type
conf
DOI
10.1109/ISWC.2002.1167231
Filename
1167231
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