Title :
Levy processes for image modeling
Author :
Poliannikov, Oleg V. ; Bao, Yufang ; Krim, Hamid
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
Nonhomogenous random fields are known to be well adapted to modeling a wide class of images. Their computational complexity generally causes their lack of appeal, we propose a more efficient model capable of capturing textures, shapes, as well as jumps typically encountered in infra-red images. The so-called Levy random fields as we show, can indeed represent a very well adapted alternative for inference applications and the like
Keywords :
Bayes methods; computational complexity; image texture; infrared imaging; random processes; Baysian inference; Levy processes; computational complexity; image modeling; image shape; image texture; inference applications; infra-red images; nonhomogenous random fields; object recognition; Bayesian methods; Educational institutions; Focusing; Image edge detection; Image texture analysis; Integral equations; Optical arrays; Shape; Statistical distributions; Stochastic processes;
Conference_Titel :
Higher-Order Statistics, 1999. Proceedings of the IEEE Signal Processing Workshop on
Conference_Location :
Caesarea
Print_ISBN :
0-7695-0140-0
DOI :
10.1109/HOST.1999.778732