Title :
Investigation of lifetime limiting microdefects in polycrystalline silicon for photovoltaic applications
Author :
Werner, Martina ; Weber, Eicke R. ; McHugo, Scott ; Bailey, Jeff
Author_Institution :
Max-Planck-Inst. fur Mikrostrukturphys., Halle, Germany
Abstract :
Electron microscopy techniques were applied to the study of intragranular microdefects in as-grown and intentionally Fe contaminated polycrystalline silicon solar cell material. Electron-energy-loss spectroscopy (EELS) imaging revealed bright contrasts in metal diffused samples and with smaller concentration in as-grown material, probably due to metal precipitates. High-resolution and analytical electron microscopy identified Cu- and Fe-silicide particles in the contaminated specimen. These results demonstrate that intragranular microdefects exist in polycrystalline Si which act as nucleation sites for metal contaminants and lend support to the model that metal-decorated microdefects are decisive lifetime killers in as-grown material
Keywords :
carrier lifetime; crystal defects; electron energy loss spectra; electron microscopy; elemental semiconductors; nucleation; silicon; solar cells; Cu-silicide particles; Fe; Fe contaminated polycrystalline solar cell material; Fe-silicide particles; Si; electron microscopy techniques; electron-energy-loss spectroscopy; intragranular microdefects; lifetime killers; lifetime limiting microdefects; metal contaminants; metal diffused samples; nucleation sites; photovoltaic applications; polycrystalline Si; Electron microscopy; High-resolution imaging; Iron; Length measurement; Photovoltaic cells; Photovoltaic systems; Pollution measurement; Silicon; Solar power generation; Spectroscopy;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520525
