DocumentCode
2977144
Title
Defect-oriented BIST quality analysis
Author
Kruus, H. ; Ubar, R. ; Raik, J.
Author_Institution
Dept. Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear
2010
fDate
4-6 Oct. 2010
Firstpage
153
Lastpage
156
Abstract
In this paper, the efficiency of the built-in self-test pseudorandom patterns generated by an LFSR is investigated and compared for different fault classes. In particular, the need for defect-oriented testing is taken into account. Experimental research showed that the quality of BIST estimated using the SAF model can be too optimistic, and that extended fault classes for evaluation of BIST and determining the acceptable length of BIST sequences are needed.
Keywords
CMOS logic circuits; built-in self test; logic gates; BIST sequences; CMOS gates; LFSR; built-in self-test pseudorandom patterns; defect-oriented BIST quality analysis; defect-oriented testing; extended fault classes; Built-in self-test; Circuit faults; Integrated circuit modeling; Logic gates; Mathematical model; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2010 12th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4244-7356-4
Electronic_ISBN
1736-3705
Type
conf
DOI
10.1109/BEC.2010.5629724
Filename
5629724
Link To Document