Title :
Defect-oriented BIST quality analysis
Author :
Kruus, H. ; Ubar, R. ; Raik, J.
Author_Institution :
Dept. Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
Abstract :
In this paper, the efficiency of the built-in self-test pseudorandom patterns generated by an LFSR is investigated and compared for different fault classes. In particular, the need for defect-oriented testing is taken into account. Experimental research showed that the quality of BIST estimated using the SAF model can be too optimistic, and that extended fault classes for evaluation of BIST and determining the acceptable length of BIST sequences are needed.
Keywords :
CMOS logic circuits; built-in self test; logic gates; BIST sequences; CMOS gates; LFSR; built-in self-test pseudorandom patterns; defect-oriented BIST quality analysis; defect-oriented testing; extended fault classes; Built-in self-test; Circuit faults; Integrated circuit modeling; Logic gates; Mathematical model; Semiconductor device modeling;
Conference_Titel :
Electronics Conference (BEC), 2010 12th Biennial Baltic
Conference_Location :
Tallinn
Print_ISBN :
978-1-4244-7356-4
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2010.5629724
