DocumentCode :
2977176
Title :
Extremely High gm> 2.2 S/mm and fT> 550 GHz in 30-nm Enhancement-Mode InP-HEMTs with Pt/Mo/Ti/Pt/Au Buried Gate
Author :
Shinohara, K. ; Ha, Wonill ; Rodwell, Mark J.W. ; Brar, Berinder
Author_Institution :
Teledyne Sci. Co., Thousand Oaks
fYear :
2007
fDate :
14-18 May 2007
Firstpage :
18
Lastpage :
21
Abstract :
We have successfully developed 30-nm enhancement-mode (E-mode) InGaAs/InAlAs high electron mobility transistors (HEMTs) with an extremely high transconductance (gm ) of 2.22 S/mm, a current gain cutoff frequency (fT) of 554 GHz, and a maximum oscillation frequency (fmax ) of 358 GHz. The excellent high-speed performance was obtained by using a Pt/Mo/ Ti/Pt/Au buried gate technology, which enabled E-mode operation for very short 30-nm HEMTs while maintaining a low access resistance as well as a low gate leakage current. The effectively short gate-to-channel distance suppressed the short channel effect, resulting in a very high gm independent of the gate length (Lg ) and a greatly reduced output conductance (gd).
Keywords :
aluminium compounds; gallium arsenide; gold; high electron mobility transistors; indium compounds; leakage currents; molybdenum; platinum; submillimetre wave transistors; titanium; InGaAs-InAlAs; InP-Au; InP-Mo; InP-Pt; InP-Ti; buried gate technology; enhancement-mode HEMT; frequency 358 GHz; frequency 554 GHz; high electron mobility transistor; leakage current; short channel effect; size 30 nm; transconductance; Cutoff frequency; Electron mobility; Gold; HEMTs; Indium compounds; Indium gallium arsenide; Indium phosphide; Leakage current; MODFETs; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
ISSN :
1092-8669
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2007.380678
Filename :
4265868
Link To Document :
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