• DocumentCode
    2977276
  • Title

    Accurate Simulation of the Electron Density of Surrounding Gate Transistors

  • Author

    Ruiz, F.G. ; Tienda-Luna, I.M. ; Godoy, A. ; Sampedro, C. ; Gámiz, F.

  • Author_Institution
    Dept. of Electron., Univ. of Granada, Granada
  • fYear
    2009
  • fDate
    11-13 Feb. 2009
  • Firstpage
    192
  • Lastpage
    195
  • Abstract
    In this work we have studied the influence of the effective mass anisotropy on the quantum electron density (QED) of surrounding gate transistors (SGTs). We show that, despite the cylindrical symmetry of the circular cross-section SGTs, the electron density is not symmetric due to the anisotropy of the silicon conduction band. We have compared the quantum electron densities obtained in devices with different orientations, showing interesting behaviors when combining effective mass anisotropy with nonhomogeneous electrostatics due to the presence of corners.
  • Keywords
    MOSFET; conduction bands; electrostatics; circular cross-section; cylindrical symmetry; mass anisotropy; nonhomogeneous electrostatics; quantum electron density; silicon conduction band; surrounding gate transistors; Anisotropic magnetoresistance; Effective mass; Electrons; Electrostatics; Geometry; MOSFETs; Poisson equations; Silicon; Solid modeling; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • Conference_Location
    Santiago de Compostela
  • Print_ISBN
    978-1-4244-2838-0
  • Electronic_ISBN
    978-1-4244-2839-7
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800463
  • Filename
    4800463