DocumentCode :
2977276
Title :
Accurate Simulation of the Electron Density of Surrounding Gate Transistors
Author :
Ruiz, F.G. ; Tienda-Luna, I.M. ; Godoy, A. ; Sampedro, C. ; Gámiz, F.
Author_Institution :
Dept. of Electron., Univ. of Granada, Granada
fYear :
2009
fDate :
11-13 Feb. 2009
Firstpage :
192
Lastpage :
195
Abstract :
In this work we have studied the influence of the effective mass anisotropy on the quantum electron density (QED) of surrounding gate transistors (SGTs). We show that, despite the cylindrical symmetry of the circular cross-section SGTs, the electron density is not symmetric due to the anisotropy of the silicon conduction band. We have compared the quantum electron densities obtained in devices with different orientations, showing interesting behaviors when combining effective mass anisotropy with nonhomogeneous electrostatics due to the presence of corners.
Keywords :
MOSFET; conduction bands; electrostatics; circular cross-section; cylindrical symmetry; mass anisotropy; nonhomogeneous electrostatics; quantum electron density; silicon conduction band; surrounding gate transistors; Anisotropic magnetoresistance; Effective mass; Electrons; Electrostatics; Geometry; MOSFETs; Poisson equations; Silicon; Solid modeling; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices, 2009. CDE 2009. Spanish Conference on
Conference_Location :
Santiago de Compostela
Print_ISBN :
978-1-4244-2838-0
Electronic_ISBN :
978-1-4244-2839-7
Type :
conf
DOI :
10.1109/SCED.2009.4800463
Filename :
4800463
Link To Document :
بازگشت