Research on the Factors of Independent Innovation Pattern Based on Patent Data Measurement

A large number of researches at home and abroad have indicated that patent data can play the role of quantitative analysis of measurement innovation activities excellently. This article has made quantitative analysis of patent factors in independent innovation pattern from the perspectives of patent quantity and quality based on summarizing the current measurement innovation activities of patent data applied at home and abroad and has reflected the property right factors of the independent innovation pattern by applying indexes of the patent self-citing rate and non-self-citing rate. This article has built the quantitative analysis index system of enterprise independent innovation based on patent metrology that is suitable for the actual conditions in China so as to complete the research into the independent innovation pattern factors thus providing relevant theoretical analysis model and tools for the study and selection of independent innovation pattern of China´s enterprises.