DocumentCode :
2977297
Title :
Highly reliable operation of InGaAlAs/InGaAsP integrated lasers
Author :
Shinoda, K. ; Makino, S. ; Kitatani, T. ; Shiota, T. ; Aoki, M.
Author_Institution :
Hitachi, Ltd., Tokyo
fYear :
2007
fDate :
14-18 May 2007
Firstpage :
39
Lastpage :
42
Abstract :
We present a novel concept of free integration of InGaAlAs-based and InGaAsP-based components on a single InP substrate for higher-performance long-wavelength opto-electronic devices. A butt-jointing process with in situ cleaning was used to obtain high-quality integration of InGaAlAs and InGaAsP components. Combinations of InGaAlAs lasers integrated with InGaAsP, and InGaAsP lasers integrated with InGaAlAs, were fabricated using this process. Aging tests on both types of lasers showed no significant degradation in their driving current. It can thus be concluded that the free integration of InGaAlAs and InGaAsP is promising for development of higher-performance devices for the next generation of optical communications applications.
Keywords :
ageing; aluminium compounds; fibre lasers; gallium arsenide; indium compounds; integrated optoelectronics; InGaAlAs-InGaAsP; InGaAlAs-InGaAsP integrated laser; InP; InP substrate; aging tests; butt-jointing process; long-wavelength opto-electronic devices; optical communications application; Aging; Cleaning; Epitaxial growth; Etching; Indium phosphide; Optical materials; Optoelectronic devices; Substrates; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
ISSN :
1092-8669
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2007.381117
Filename :
4265874
Link To Document :
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