A Two-Dimensional Mode! for Predicting Substrate Current in Submicron MOSFETS
Author :
Agostinelli, V.M., Jr. ; Bordelon, T.J. ; Wang, X.L. ; Yeap, C.F. ; Tasch, A.F. ; Maziar, C.M.
Author_Institution :
The University of Texas at Austin
fYear :
1992
fDate :
21-24 June 1992
Keywords :
Current density; Current measurement; Energy conservation; Equations; Impact ionization; Length measurement; MOSFETs; Predictive models; Two dimensional displays; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 1992. Digest. 50th Annual
