Title :
Turn-off behaviour of high voltage NPT- and FS-IGBT
Author :
Eckel, Hans-Guenter ; Fleisch, Karl
Author_Institution :
Inst. of Electr. Power Eng., Univ. of Rostock, Rostock
Abstract :
A simple but physical based one dimensional model is used to characterize the turn-off of high voltage IGBTs. The dependence of the overvoltage and the peak electric field on the gate driving conditions is analyzed. The transition from a triangular to a trapezoidal electric field has a major impact on the turn-off behaviour. If this transition occurs during the voltage slope, the dv/dt increases significantly. If the field-stop layer is reached during the current slope, the current snaps off, which leads to a second voltage spike with a high absolute voltage but only a moderate peak field.
Keywords :
insulated gate bipolar transistors; overvoltage protection; power bipolar transistors; FS-IGBT; MOS controlled device; field-stop insulated gate bipolar transistor; high voltage NPT; one dimensional model; overvoltage analysis; trapezoidal electric field; turn-off behaviour; voltage spike; Charge carrier lifetime; Charge carriers; Electronic mail; Insulated gate bipolar transistors; Inverters; Medium voltage; Power engineering; Silicon; Switching loss; Voltage control; IGBT; MOS controlled device;
Conference_Titel :
Power Electronics and Motion Control Conference, 2008. EPE-PEMC 2008. 13th
Conference_Location :
Poznan
Print_ISBN :
978-1-4244-1741-4
Electronic_ISBN :
978-1-4244-1742-1
DOI :
10.1109/EPEPEMC.2008.4635243