Title :
High Current and Low Turn-On Voltage InAlAs/InGaAsSb/InGaAs Heterojunction Bipolar Transistor
Author :
Chen, Shu-Han ; Wang, Sheng-Yu ; Teng, Kuo-Hung ; Chyi, Jen-Inn
Author_Institution :
Nat. Central Univ., Jhongli
Abstract :
This study investigates the DC characteristics of a heterojunction bipolar transistor (HBT) with a quaternary InGaAsSb base, grown by solid-source molecular beam epitaxy (MBE). The novel In0.52Al0.48As/InxGa1-xAs1-ySby HBT has a lower base/emitter (B/E) junction turn-on voltage, a lower VCE.offset voltage and a greater junction ideality factor than conventional In0.52Al0.48As/In0.53Ga0.47As single HBT structures. The quaternary InxGa1-xAs1-ySby base provides a type-I B/E junction and a type-II base/collector (B/C) junction, suggesting that the InGaAsSb base HBT has great potential for low-power and high-speed applications.
Keywords :
gallium arsenide; heterojunction bipolar transistors; indium compounds; low-power electronics; molecular beam epitaxial growth; DC characteristics; HBT; InAlAs-InGaAsSb-InGaAs; heterojunction bipolar transistor; low power application; molecular beam epitaxy; quaternary InGaAsSb base; turn-on voltage; Current density; Double heterojunction bipolar transistors; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Indium phosphide; Low voltage; Molecular beam epitaxial growth; Photonic band gap; Substrates;
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
DOI :
10.1109/ICIPRM.2007.381143