DocumentCode :
2977959
Title :
Kinetic theory of stochastically heated capacitive RF discharges
Author :
Zouding Wang ; Lichtenberg, A.J. ; Cohen, Ronald H.
Author_Institution :
California Univ., Berkeley, CA, USA
fYear :
1996
fDate :
3-5 June 1996
Firstpage :
155
Abstract :
Summary form only given, as follows. In a capacitive discharge nearly all of the applied voltage appears across the oscillating sheaths, leading to stochastic sheath heating as the dominant heating mechanism at low pressures. The result is an electron energy distribution function (EEDF) that approximates a two-temperature Maxwellian, as seen both experimentally and in numerical simulations. We have used the fundamental kinetic equations to obtain the EEDF over the low pressure range p=1-50 mTorr in argon. The major additional assumption is that the low temperature electrons are trapped in a square well potential that prevents them from interacting with the sheath heating fields. The calculated EEDF can he approximated by a two temperature Maxwellian. We use this approximation to determine the sheath density and the sheath thickness, which are parameters in the kinetic calculation. This gives us a fully self-consistent solution for a given pressure and applied voltage. The effect of ohmic heating is determined by comparing the results with and without the inclusion of this effect. The results are compared to those found in experiments and simulations, obtaining reasonable agreement.
Keywords :
argon; 1 to 50 mtorr; Ar; applied voltage; electron energy distribution function; fundamental kinetic equations; kinetic theory; low pressure; low temperature electrons; ohmic heating; oscillating sheaths; self-consistent solution; sheath density; sheath thickness; square well potential; stochastic sheath heating; stochastically heated capacitive RF discharges; two temperature Maxwellian; two-temperature Maxwellian; Distribution functions; Electrons; Heating; Kinetic theory; Maxwell equations; Numerical simulation; Radio frequency; Stochastic processes; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3322-5
Type :
conf
DOI :
10.1109/PLASMA.1996.550681
Filename :
550681
Link To Document :
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