DocumentCode :
2978150
Title :
MNOS structure: towards efficient and reliable silicon nanocrystal-based LEDs
Author :
Peralvarez, M. ; Carreras, J. ; Barreto, J. ; Morales, A. ; Dominguez, C. ; Garrido, B.
Author_Institution :
Dept. d´Electron., Univ. de Barcelona, Barcelona
fYear :
2009
fDate :
11-13 Feb. 2009
Firstpage :
387
Lastpage :
389
Abstract :
Efficiency and reliability improvement of silicon nanocrystals in silicon oxide light-emitting devices is reported. The emission power efficiency is enhanced up to ~1% by depositing a ~15-nm silicon nitride buffer onto the active layer. The presence of this additional layer reduces the leakage current through the structure, leading to an effective increase of the power efficiency without significant effects on the operation voltages. Furthermore, the silicon nitride cools down the electrons that reach the top electrode. Both effects lead to a device degradation reduction of up to 50%.
Keywords :
MIS devices; leakage currents; light emitting diodes; nanostructured materials; silicon; silicon compounds; LEDs; MNOS structure; MOS structure; Si3N4-Si-SiO2; emission power efficiency; field-effect light emitting devices; leakage current; nanocrystals; Chemical vapor deposition; Degradation; Electrodes; Light emitting diodes; Luminescence; Nanocrystals; Plasma devices; Plasma temperature; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices, 2009. CDE 2009. Spanish Conference on
Conference_Location :
Santiago de Compostela
Print_ISBN :
978-1-4244-2838-0
Type :
conf
DOI :
10.1109/SCED.2009.4800514
Filename :
4800514
Link To Document :
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