• DocumentCode
    2978150
  • Title

    MNOS structure: towards efficient and reliable silicon nanocrystal-based LEDs

  • Author

    Peralvarez, M. ; Carreras, J. ; Barreto, J. ; Morales, A. ; Dominguez, C. ; Garrido, B.

  • Author_Institution
    Dept. d´Electron., Univ. de Barcelona, Barcelona
  • fYear
    2009
  • fDate
    11-13 Feb. 2009
  • Firstpage
    387
  • Lastpage
    389
  • Abstract
    Efficiency and reliability improvement of silicon nanocrystals in silicon oxide light-emitting devices is reported. The emission power efficiency is enhanced up to ~1% by depositing a ~15-nm silicon nitride buffer onto the active layer. The presence of this additional layer reduces the leakage current through the structure, leading to an effective increase of the power efficiency without significant effects on the operation voltages. Furthermore, the silicon nitride cools down the electrons that reach the top electrode. Both effects lead to a device degradation reduction of up to 50%.
  • Keywords
    MIS devices; leakage currents; light emitting diodes; nanostructured materials; silicon; silicon compounds; LEDs; MNOS structure; MOS structure; Si3N4-Si-SiO2; emission power efficiency; field-effect light emitting devices; leakage current; nanocrystals; Chemical vapor deposition; Degradation; Electrodes; Light emitting diodes; Luminescence; Nanocrystals; Plasma devices; Plasma temperature; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • Conference_Location
    Santiago de Compostela
  • Print_ISBN
    978-1-4244-2838-0
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800514
  • Filename
    4800514