DocumentCode
2978150
Title
MNOS structure: towards efficient and reliable silicon nanocrystal-based LEDs
Author
Peralvarez, M. ; Carreras, J. ; Barreto, J. ; Morales, A. ; Dominguez, C. ; Garrido, B.
Author_Institution
Dept. d´Electron., Univ. de Barcelona, Barcelona
fYear
2009
fDate
11-13 Feb. 2009
Firstpage
387
Lastpage
389
Abstract
Efficiency and reliability improvement of silicon nanocrystals in silicon oxide light-emitting devices is reported. The emission power efficiency is enhanced up to ~1% by depositing a ~15-nm silicon nitride buffer onto the active layer. The presence of this additional layer reduces the leakage current through the structure, leading to an effective increase of the power efficiency without significant effects on the operation voltages. Furthermore, the silicon nitride cools down the electrons that reach the top electrode. Both effects lead to a device degradation reduction of up to 50%.
Keywords
MIS devices; leakage currents; light emitting diodes; nanostructured materials; silicon; silicon compounds; LEDs; MNOS structure; MOS structure; Si3N4-Si-SiO2; emission power efficiency; field-effect light emitting devices; leakage current; nanocrystals; Chemical vapor deposition; Degradation; Electrodes; Light emitting diodes; Luminescence; Nanocrystals; Plasma devices; Plasma temperature; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2009. CDE 2009. Spanish Conference on
Conference_Location
Santiago de Compostela
Print_ISBN
978-1-4244-2838-0
Type
conf
DOI
10.1109/SCED.2009.4800514
Filename
4800514
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