DocumentCode :
2979110
Title :
Epitaxial Growth of (In)GaPN Systems for Monolithic Optoelectronic Integrated Circuits on Si Substrates
Author :
Yonezu, H. ; Furukawa, Y. ; Wakahara, A.
Author_Institution :
Toyohashi Univ. of Technol., Toyohashi
fYear :
2007
fDate :
14-18 May 2007
Firstpage :
451
Lastpage :
453
Abstract :
The fundamental problems of the growth of III-V compounds on a Si substrate were overcome. As a result, structural defect-free GaPN and InGaPN layers were grown on a Si substrate. LEDs and Si MOSFETs, which are elemental devices for OEICs, were monolithically merged in a single chip. The developed processing flow was based on a conventional MOSFET processing flow. The growth and fabrication process technologies are effective for the realization of monolithic OEICs.
Keywords :
III-V semiconductors; epitaxial growth; gallium compounds; indium compounds; integrated circuit technology; integrated optoelectronics; light emitting diodes; phosphorus compounds; semiconductor growth; silicon; GaPN; III-V compounds; InGaPN; LED; MOSFET; OEIC; Si; epitaxial growth; fabrication process technology; monolithic optoelectronic integrated circuits; processing flow; silicon substrate; structural defect-free layers; Circuit faults; Epitaxial growth; Large scale integration; Lattices; Light emitting diodes; MOSFETs; Molecular beam epitaxial growth; Monolithic integrated circuits; Stacking; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
ISSN :
1092-8669
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2007.381223
Filename :
4265980
Link To Document :
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