• DocumentCode
    2979117
  • Title

    Transit time broadening: a pulsed Doppler ultrasound perspective

  • Author

    Yu, Alfred C H ; Steinman, Aaron H. ; Lui, Elaine Y L ; Cobbold, Richard S C

  • Author_Institution
    Inst. of Biomaterials & Biomed. Eng., Toronto Univ., Ont., Canada
  • Volume
    3
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    2113
  • Abstract
    Many studies on transit time broadening have been performed to characterize its effect on the Doppler spectrum. However, the dependence of transit time broadening on an important pulsed Doppler ultrasound parameter - the range gate used for depth localization - has not been rigorously addressed. The purpose of this paper is to provide an analysis of how the range gate may contribute to transit time broadening from a pulsed Doppler perspective. Our analysis and simulation results show that the range gate can contribute to transit time broadening at small beam-flow angles. In particular, at such angles, the spectral broadening bandwidth is dependent on the effective axial length of the sample volume. On the other hand, at higher beam-flow angles, the spectral broadening bandwidth is dependent on ultrasound beam parameters such as local length and aperture size: a finding that is consistent with previous studies. Our analysis also shows that there exists a transition beam-flow angle at which the parameters governing transit time broadening undergo a significant change.
  • Keywords
    Doppler broadening; biomedical ultrasonics; blood flow measurement; signal sampling; Doppler spectrum; beam-flow angles; pulsed Doppler ultrasound; range gate; sample volume; spectral broadening bandwidth; transit time broadening; transition beam-flow angle; ultrasound beam parameters; Amplitude modulation; Analytical models; Apertures; Bandwidth; Biomedical engineering; Equations; Frequency; Performance analysis; Scattering; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2004 IEEE
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-8412-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2004.1418254
  • Filename
    1418254