• DocumentCode
    2979151
  • Title

    Growth Process of GaAs Cap Layers on GaSb/GaAs Quantum Dot Surfaces

  • Author

    Uesugi, K. ; Sato, M. ; Idutsu, Y. ; Suemune, I.

  • Author_Institution
    Muroran Inst. of Technol., Muroran
  • fYear
    2007
  • fDate
    14-18 May 2007
  • Firstpage
    462
  • Lastpage
    465
  • Abstract
    Self-assembled GaSb quantum dots (QDs) have been grown on GaAs(001) surface by metal-organic molecular beam epitaxy in the Stranski-Krastanow growth mode. The density of GaSb QDs in a wide range from 5times108 cm-2 to 4times1010 cm-2 can be controlled by changing the growth temperature between 400degC and 510degC. Etching of GaSb QDs was observed by the supply of trisdimethylaminoarcenic and trisdimethylaminoantimony at the temperature above 450degC. Luminescence from the GaSb/GaAs QDs showed a blue shift by the replacement of Sb with As atoms during GaAs cap growth. To realize long-wavelength emission, 2-step growth of GaAs cap layer was proposed. After GaAs QD structure was grown on the terrace surface between neighboring GaSb QDs at 400degC, the GaAs layer was grown to bury the GaSb and GaAs QDs at 450degC. The red shift of the luminescence peak up to 1.22 mum and the improvement of luminescent efficiency of GaSb/GaAs QDs were observed.
  • Keywords
    III-V semiconductors; chemical beam epitaxial growth; etching; gallium arsenide; gallium compounds; luminescence; red shift; self-assembly; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum dots; GaSb-GaAs; Stranski-Krastanow growth mode; blue shift; cap layers; density; etching; growth temperature; long-wavelength emission; luminescence; luminescent efficiency; metal-organic molecular beam epitaxy; quantum dot surfaces; red shift; self-assembly; temperature 400 degC to 510 degC; terrace surfaces; trisdimethylaminoantimony; trisdimethylaminoarcenic; Atomic layer deposition; Etching; Gallium arsenide; Indium phosphide; Luminescence; Molecular beam epitaxial growth; Quantum dots; Substrates; Surface cracks; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • Conference_Location
    Matsue
  • ISSN
    1092-8669
  • Print_ISBN
    1-4244-0875-X
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2007.381226
  • Filename
    4265983