DocumentCode :
2979287
Title :
InAs Quantum Dots Grown on Selective Areas with a Metal Mask for Photonic-Crystal-Based Ultra-Small and Ultra-Fast All Optical Devices
Author :
Ozaki, N. ; Takata, Y. ; Ohkouchi, S. ; Sugimoto, Y. ; Ikeda, N. ; Watanabe, Y. ; Kitagawa, Y. ; Mizutani, A. ; Asakawa, K.
Author_Institution :
Univ. of Tsukuba, Tsukuba
fYear :
2007
fDate :
14-18 May 2007
Firstpage :
493
Lastpage :
496
Abstract :
A metal-mask (MM) method for selective-area-growth (SAG) of self-assembled InAs quantum dots (QDs) on a GaAs substrate was developed for applications of ultra-small and ultra-fast all optical devices based on a combination of QD and photonic crystal waveguides (PC-WGs). Successful SAG of QDs with high density and high optical quality comparable to conventional InAs-QDs grown without the MM was confirmed by atomic force microscopy and photoluminescence (PL) measurements. The QD density was 4times1010 cm-2 and FWHM of the PL emission was around 30 meV at room temperature. By insertion of a strain-reducing layer on the QD, the PL peak wavelength was controlled from 1240 nm to 1320 nm. The MM method is promising for realizing the PC-based all optical devices, which require SAG of QDs and a QD ensemble with a different absorption-peak wavelength in a different area.
Keywords :
atomic force microscopy; gallium arsenide; photonic crystals; quantum dots; waveguides; GaAs substrate; absorption-peak wavelength; atomic force microscopy; metal mask; metal-mask method; photoluminescence measurements; photonic crystal waveguides; photonic-crystal; selective-area-growth; self-assembled InAs quantum dots; strain-reducing layer; ultra-fast all optical devices; ultra-small optical devices; Atom optics; Atomic force microscopy; Atomic measurements; Force measurement; Gallium arsenide; Optical devices; Optical microscopy; Optical waveguides; Photonic crystals; Quantum dots;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
ISSN :
1092-8669
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2007.381235
Filename :
4265992
Link To Document :
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