Title :
Radiation effects in future electronics from device to systems — Roundtable report
Author :
Flament, Olivier ; Brichard, Benoit ; Chugg, Andrew ; Dyer, Clive ; Edwards, Robert ; Ibe, Eishi ; Lacoe, Ron ; Paccagnella, Alessandro ; Holmes-Siedle, Andrew ; Leray, Jean-Luc
Author_Institution :
Bruyeres-le-Chatel, CEA-DIF, Arpajon, France
Abstract :
Considering the technology trends of future electronics, panelists have reviewed some of the most demanding applications. These sectors were successively, the new nuclear physics facilities, for knowledge and for energy, and the vital issue of reliability of avionics systems.
Keywords :
avionics; radiation effects; reliability; avionics system; electronics; nuclear physics facility; radiation effect; Radiation effects; Harsh environment; Nanoelectronics; Radiation effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205427
