DocumentCode
2979466
Title
InAs Wrap-Gate Nanowire Transistors
Author
Wernersson, Lars-Erik
Author_Institution
Lund Univ., Lund
fYear
2007
fDate
14-18 May 2007
Firstpage
527
Lastpage
529
Abstract
InAs nanowire wrap-gate transistors have been fabricated in a vertical geometry using matrices of 11times11 nanowires. The fabrication process is based on conventional and scalable technologies that are adopted for the nanowire transistors. A SiNx layer is used as gate dielectric and a wrap-gate of 80 nm gate length is formed. These transistors show good DC characteristics with drive currents above 1 mA and a transconductance of 0.28 mS at Vsd = 0.5 V. The transistors operate in depletion mode.
Keywords
III-V semiconductors; electric current; indium compounds; insulated gate field effect transistors; nanoelectronics; nanowires; semiconductor quantum wires; InAs; conductance 0.28 mS; depletion mode operation; drive currents; gate dielectric layer; gate length; size 80 nm; transconductance; voltage 0.5 V; wrap-gate nanowire transistors; wrapped-insulator-gate field-effect transistors; Conducting materials; Conference proceedings; Dielectric substrates; Fabrication; Geometry; Gold; Indium phosphide; Silicon compounds; Wet etching; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location
Matsue
ISSN
1092-8669
Print_ISBN
1-4244-0875-X
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2007.381244
Filename
4266001
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