• DocumentCode
    2979466
  • Title

    InAs Wrap-Gate Nanowire Transistors

  • Author

    Wernersson, Lars-Erik

  • Author_Institution
    Lund Univ., Lund
  • fYear
    2007
  • fDate
    14-18 May 2007
  • Firstpage
    527
  • Lastpage
    529
  • Abstract
    InAs nanowire wrap-gate transistors have been fabricated in a vertical geometry using matrices of 11times11 nanowires. The fabrication process is based on conventional and scalable technologies that are adopted for the nanowire transistors. A SiNx layer is used as gate dielectric and a wrap-gate of 80 nm gate length is formed. These transistors show good DC characteristics with drive currents above 1 mA and a transconductance of 0.28 mS at Vsd = 0.5 V. The transistors operate in depletion mode.
  • Keywords
    III-V semiconductors; electric current; indium compounds; insulated gate field effect transistors; nanoelectronics; nanowires; semiconductor quantum wires; InAs; conductance 0.28 mS; depletion mode operation; drive currents; gate dielectric layer; gate length; size 80 nm; transconductance; voltage 0.5 V; wrap-gate nanowire transistors; wrapped-insulator-gate field-effect transistors; Conducting materials; Conference proceedings; Dielectric substrates; Fabrication; Geometry; Gold; Indium phosphide; Silicon compounds; Wet etching; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • Conference_Location
    Matsue
  • ISSN
    1092-8669
  • Print_ISBN
    1-4244-0875-X
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2007.381244
  • Filename
    4266001