Title :
Data path testing using time-shared resource boundary scan
Author :
Saliba, Elie ; Makki, Rafic
Author_Institution :
North Carolina Univ., Charlotte, NC, USA
Abstract :
A time-shared resource organization is established for boundary scan registers. Modules under test share the scan latches in the boundary scan which results in a reduction in test serialization and enhances the process of fault location
Keywords :
logic testing; boundary scan registers; data path testing; fault location; scan latches; test serialization; time-shared resource boundary scan; Circuit faults; Circuit simulation; Circuit testing; Clocks; Fault location; Impedance; Latches; Logic; Multiplexing; Very large scale integration;
Conference_Titel :
Southeastcon '88., IEEE Conference Proceedings
Conference_Location :
Knoxville, TN
DOI :
10.1109/SECON.1988.194841
