DocumentCode :
2980703
Title :
Characterizations of a GaInNAs double-barrier quantum-well infrared photo-detector with the near-infrared photo-detection
Author :
Ma, B.S. ; Fan, W.J. ; Dang, Y.X. ; Cheah, W.K. ; Loke, W.K. ; Liu, W. ; Sentosa, D. ; Liu, Y.W. ; Lew, K.L. ; Wang, H. ; Yoon, S.F. ; Zhang, D.H.
Author_Institution :
Nanyang Technol. Univ., Singapore
fYear :
2007
fDate :
20-22 Dec. 2007
Firstpage :
193
Lastpage :
196
Abstract :
A novel GalnNAs/AlAs/AlGaAs double-barrier quantum-well-infrared-photo-detector was characterized by photoluminescence, x-ray diffraction, photoluminescence excitation, photocurrent spectra and dark current measurements. The photoluminescence peak at ~1.2 eV and the photocurrent peak at 1.24 mum originate from the interband transition and inter-subband transition, respectively, in the GalnNAs well. The dark current is as low as 10-8~10-9 A. After annealing, the energy blue shift of the GINA photoluminescence peak decreases with increasing annealing temperature, and the energy difference between the GalnNAs photoluminescence excitation peak and the detection energy decreases with increasing detection energy. The kldrp calculations agree with the above observations.
Keywords :
X-ray diffraction; aluminium compounds; annealing; dark conductivity; gallium arsenide; gallium compounds; indium compounds; infrared detectors; photoconductivity; photodetectors; photoluminescence; quantum well devices; semiconductor quantum wells; spectral line shift; GaInNAs-AlAs-AlGaAs; X-ray diffraction; annealing; dark current; double-barrier quantum-well infrared photo-detector; energy blue shift; inter-subband transition; interband transition; kldrp calculations; near-infrared photo-detection; photocurrent spectra; photoluminescence; Annealing; Current measurement; Dark current; Nitrogen; Photoconductivity; Photoluminescence; Quantum wells; Temperature; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
Type :
conf
DOI :
10.1109/EDSSC.2007.4450095
Filename :
4450095
Link To Document :
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