Title :
Single event effects on hard-by-design latches
Author :
Wang, Liang ; Li, Yuhong ; Suge Yue ; Zhao, Yuanfu ; Fan, Long ; Liu, Liquan
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing, China
Abstract :
Chip with four kinds of hard-by-design latches and an unhardened one is fabricated with a commercial 0.18 mum process, and tested for their SEL and SEU susceptibility. Some of the latches are tested with heavy-ions for the first time. Simulation and test results prove that the hardening methods we used are very effective. Discussions and comparisons are made among test results.
Keywords :
flip-flops; logic design; hard-by-design latches; hardening method; simulation; single event effect; size 0.18 mum; Circuit simulation; Circuit testing; Epitaxial layers; Inverters; Latches; Microelectronics; Random access memory; Redundancy; Single event upset; Voltage; Hard-by-Design; SEL; SEU; Single Event Effect; heavy ion; latches;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205498
