Highlights of laser testing capabilities regarding the understanding of SEE in SRAM based FPGAs

Author

Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, N. ; Leveugle, R. ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, V. ; Velazco, R.

Author_Institution

EADS Innovation Works, Suresnes, France

fYear

2007

fDate

10-14 Sept. 2007

Firstpage

1

Lastpage

6

Abstract

This paper presents the applications of pulsed laser experiments for testing the reliability of SRAM-based FPGAs regarding natural radiation environment. The final objective is to understand the basement of configuration memory sensitivity and to highlight the testing possibilities provided by laser fault injection in running application. Static (Virtex 2) and dynamic (Virtex 1) experiments are presented.

Keywords

SRAM chips; field programmable gate arrays; SRAM based FPGA; Virtex 1; Virtex 2; laser fault injection; laser testing capabilities; natural radiation environment; pulsed laser; running application; Aerodynamics; Automatic control; Circuit faults; Circuit testing; Electronic equipment testing; Field programmable gate arrays; Laboratories; Optical pulses; Radiation safety; Random access memory; SEFI; SRAM Based FPGA; laser-induced single-event effects; static and dynamic testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on

Conference_Location

Deauville

ISSN

0379-6566

Print_ISBN

978-1-4244-1704-9

Type

conf

DOI

10.1109/RADECS.2007.5205500

Filename

5205500