DocumentCode :
2980782
Title :
Deposition of nanocrystalline cuprous oxide films for solar cells application
Author :
Wu, J.R. ; Chiang, M.J. ; Wu, Chao-Hsin Wayne
Author_Institution :
Southern Taiwan Univ. of Tainan, Tainan
fYear :
2007
fDate :
20-22 Dec. 2007
Firstpage :
209
Lastpage :
212
Abstract :
Cuprous oxide (Cu2O), a direct band gap semiconductor with energy band gap about 2.0eV, has been regarded as one of the most promising materials for application in photovoltaic cells. Nanocrystalline cuprous oxide thin films has been deposited on glass and Si substrates by dc reactive magnetron sputtering method. The effect of substrate temperature and dc power on the nanocrystalline cuprous oxide thin films microstructure and surface morphology evolution were investigated. The microstructure and surface morphology were determined using X-ray diffractometer and FE-SEM. From FE-SEM analysis, the SEM pictures show that cuprous oxide films exhibit nanosize grains with grain size between 30~60 nm. From X-ray diffraction analysis, a peak of Cu2O(111l) was observed at the deposition conditions of DC power 100W, deposition pressure 3.3Pa and substrate temperature from 50degC to 200degC. With increasing the substrate temperature from 100degC to 200degC, additional peaks of Cu2O(110) and Cu2O(220) were observed. As the DC power was increased to 250W, the X-ray diffraction pattern shows that Cu(111) was observed. Based on the experimental results in this study, nanocyrtsalline Cu2O films were synthesized at DC power from 100W to 250W and substrate temperature from 50degC to 200degC.
Keywords :
X-ray diffraction; copper compounds; field emission electron microscopy; grain size; nanostructured materials; nanotechnology; scanning electron microscopy; semiconductor thin films; sputter deposition; sputtered coatings; surface morphology; wide band gap semiconductors; Cu2O; DC power; FE-SEM; Si; Si substrate; SiO2; X-ray diffraction; X-ray diffractometer; dc power effects; dc reactive magnetron sputtering; deposition pressure; direct band gap semiconductor; energy band gap; field emission scanning electron microscopy; glass substrate; microstructure; nanocrystalline cuprous oxide thin films; nanosize grains; photovoltaic cells; power 100 W to 250 W; pressure 3.3 Pa; solar cells; substrate temperature effects; surface morphology; temperature 50 degC to 200 degC; Magnetic materials; Microstructure; Photonic band gap; Photovoltaic cells; Semiconductor films; Sputtering; Substrates; Surface morphology; Temperature; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
Type :
conf
DOI :
10.1109/EDSSC.2007.4450099
Filename :
4450099
Link To Document :
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