DocumentCode
2980849
Title
A new mitigation approach for soft errors in embedded processors
Author
Abate, F. ; Sterpone, L. ; Violante, M.
Author_Institution
Politec. di Torino, Torino, Italy
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
6
Abstract
Embedded processors, like for example processor macros inside modern FPGAs, are becoming widely used in many applications. As soon as these devices are deployed in radioactive environments, designers need hardening solutions to mitigate radiation-induced errors. When low-cost applications have to be developed, the traditional hardware redundancy-based approaches exploiting m-way replication and voting are no longer viable as too expensive, and new mitigation techniques have to be developed. In this paper we present a new approach, based on processor duplication, checkpoint and rollback, to detect and correct soft errors affecting the memory elements of embedded processors. Preliminary fault injection results performed on a PowerPC-based system confirmed the goodness of the approach.
Keywords
fault diagnosis; field programmable gate arrays; microprocessor chips; PowerPC-based system; embedded processors; fault injection; field programmable gate arrays; hardware redundancy-based approaches; m-way replication; mitigate radiation-induced errors; processor duplication; radioactive environments; single event effects; soft errors; Arithmetic; Computer aided instruction; Costs; Fault detection; Hardware; Logic; Monitoring; Redundancy; Registers; Robustness; Embedded Processors Reliability; Fault Injection; Single Event Effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205504
Filename
5205504
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