• DocumentCode
    2981212
  • Title

    Erosion behaviour and `erodibility´ of Ag/CdO and Ag/SnO2 contacts under AC 3 and AC 4 test conditions

  • Author

    Manhart, H. ; Rieder, W.

  • Author_Institution
    Dept. of Switching Devices, Tech. Univ. of Vienna, Austria
  • fYear
    1989
  • fDate
    18-20 Sep 1989
  • Firstpage
    43
  • Lastpage
    52
  • Abstract
    Contact erosion depends on both the duration and efficiency of interaction between arc and contacts. The arc motion in a magnetic field was recorded, and the material loss caused by arc erosion was weighed. The material loss related to 1 ms of arc interaction, called erodibility, was evaluated for the contact materials Ag/CdO and Ag/SnO 2. All tests were performed in one type of commercial contactor (rated current 110 A). The erodibility was determined for new and partly eroded contacted prestressed during life tests under AC 3 and AC 4 conditions according to IEC test specification 158-1. AC 4 erosion was mainly caused by break arcs, but the effect of make arcs was negligible, whereas AC 3 erosion was due to both break and make arcs. The latter were more effective in Ag/SnO2 contacts. After AC 3 life tests the erodibility values determining the erosion of Ag/SnO 2 contacts at the site of arc formation were higher than those of Ag/CdO; after AC 4 life tests, however, there was hardly any difference between the erodibilities of the two materials
  • Keywords
    cadmium compounds; circuit-breaking arcs; composite materials; electrical contacts; life testing; materials testing; silver; tin compounds; AC 3 test conditions; AC 4 test conditions; Ag-CdO contact materials; Ag-SnO2 contact materials; IEC test specification; arc ability; arc commutation; arc erosion; arc motion; break arcs; contact erosion; contactor; erodibility; life tests; magnetic field; make arcs; material loss; Current supplies; IEC; Life testing; Materials testing; Particle scattering; Performance evaluation; Solids; Stress; TV; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/HOLM.1989.77905
  • Filename
    77905