DocumentCode :
2981244
Title :
Investigation on Effects of Uniform Left-Handed Material Layer on Reflection Characteristics of Dielectric Periodic Structure
Author :
Fang, Weihai ; Xu, Shanjia
Author_Institution :
Univ. of Sci. & Technol. of China, Hefei
fYear :
2007
fDate :
18-21 April 2007
Firstpage :
1
Lastpage :
4
Abstract :
The effects of left-handed materials (LHM) on frequency selective reflection characteristics of dielectric periodic structures are carefully investigated using a method which combines the multimode network theory with the rigorous mode matching method. It has been shown that the selective behavior of periodic structures can be modified by adding LHM layers above and below the periodic layer.
Keywords :
dielectric materials; electromagnetic wave reflection; metamaterials; mode matching; periodic structures; permittivity; dielectric structure; frequency selective reflection; left-handed materials; multimode network theory; periodic structure; permeability; permittivity; reflection characteristics; rigorous mode matching; Dielectric losses; Dielectric materials; Frequency selective surfaces; Metamaterials; Mode matching methods; Periodic structures; Permeability; Permittivity; Reflection; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2007. ICMMT '07. International Conference on
Conference_Location :
Builin
Print_ISBN :
1-4244-1049-5
Electronic_ISBN :
1-4244-1049-5
Type :
conf
DOI :
10.1109/ICMMT.2007.381339
Filename :
4266098
Link To Document :
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