Title :
Study of single-event transients in high-speed operational amplifiers
Author :
Jaulent, P. ; Pouget, V. ; Lewis, D. ; Fouillat, P.
Author_Institution :
IMS Lab., Univ. of Bordeaux 1, Talence, France
Abstract :
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
Keywords :
operational amplifiers; wideband amplifiers; ASIC design; COTS selection; high-speed operational amplifiers; single-event transients; wide bandwidth operational amplifiers; Application specific integrated circuits; Bandwidth; Circuit simulation; Extraterrestrial phenomena; Filters; Frequency; Operational amplifiers; Polarization; Space technology; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205524
