DocumentCode :
298132
Title :
Automatic target recognition using higher order neural network
Author :
Wan, Liqing ; Sun, Longhe
Author_Institution :
Electro-Opt. Equipment Res. Inst., Henan, China
Volume :
1
fYear :
1996
fDate :
20-23 May 1996
Firstpage :
221
Abstract :
Translational rotational scaling invariant (TRSI) pattern recognition is an important problem in the automatic target recognition (ATR) field. Recent research has shown that the higher order neural networks (HONN) have numerous advantages over other neural network approaches in respect of the object recognition with invariant of the object´s position size, and in-plane rotation. The major limitation of HONNs is that the number of connected weights is too large to store on most machines. For N×N image, the memory needed to store the connections is proportional to N6. This huge memory requirement limits the HONN´s application to large scale images. In this paper, we have developed an integrated method which combines the bi-directional log-polar mapping and HONN pattern recognizer. It reduces the HONN memory requirement from O(N6) to O(N2). The proposed method has been successfully verified. Finally, the results are compared with those of coarse-coding method, traditional log-polar method
Keywords :
image classification; learning (artificial intelligence); multilayer perceptrons; neural net architecture; object recognition; aircraft recognition; automatic target recognition; bi-directional log-polar mapping; combinational explosion problem; geometric invariance; higher order neural network; integrated method; neural network architecture; object recognition; pattern classification; pattern recognition; perceptron training rule; reduced memory requirement; third-order network; translational rotational scaling invariant; Image analysis; Image recognition; Large-scale systems; Layout; Neural networks; Nonlinear distortion; Object recognition; Pattern recognition; Sun; Target recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National
Conference_Location :
Dayton, OH
ISSN :
0547-3578
Print_ISBN :
0-7803-3306-3
Type :
conf
DOI :
10.1109/NAECON.1996.517646
Filename :
517646
Link To Document :
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