• DocumentCode
    2981697
  • Title

    Charge-collection and single-event upset measurements at the ISIS neutron source

  • Author

    Platt, S.P. ; Torok, Z. ; Frost, C.D. ; Ansell, S.

  • Author_Institution
    Sch. of Comput., Univ. of Central Lancashire, Preston, UK
  • fYear
    2007
  • fDate
    10-14 Sept. 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross-sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center.
  • Keywords
    field programmable gate arrays; neutron sources; ISIS neutron source; SRAM-based FPGA; VESUVIO instrument; charge-collection measurements; neutron SEU cross-sections; single-event upset measurements; Charge measurement; Current measurement; Field programmable gate arrays; Instruments; Intersymbol interference; Neutrons; Pixel; Protons; Rails; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
  • Conference_Location
    Deauville
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4244-1704-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2007.5205540
  • Filename
    5205540
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2981697