• DocumentCode
    2981824
  • Title

    Amplify-and-forward two-way relay channels: Error exponents

  • Author

    Ngo, Hien Quoc ; Quek, Tony Q S ; Shin, Hyundong

  • Author_Institution
    Inst. for Infocomm Res., Singapore, Singapore
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    2028
  • Lastpage
    2032
  • Abstract
    In a two-way relay network, two terminals exchange information over a shared wireless half-duplex channel with the help of a relay. Due to its fundamental and practical importance, there has been an increasing interest in this channel. However, surprisingly, there has been little work that characterizes the fundamental tradeoff between the communication reliability and transmission rate across all signal-to-noise ratio (SNR) ratios. In this paper, we consider amplify-and-forward (AF) two-way relaying due to its simplicity. We first derive the random coding error exponent for the link in each direction. From the exponent expression, the capacity and cutoff rate for each link are also deduced. We then put forth the notion of the bottleneck error exponent, which is the worst exponent decay between the two links, to give us insight into the fundamental tradeoff between the rate pair and information-exchange reliability of the two terminals.
  • Keywords
    telecommunication network reliability; wireless channels; amplify-and-forward two-way relay channels; amplify-and-forward two-way relaying; bottleneck error exponent; communication reliability; error exponents; information-exchange reliability; random coding error exponent; signal-to-noise ratio; two-way relay network; wireless half-duplex channel; Bidirectional control; Broadcasting; Communication channels; Loss measurement; Measurement units; Network address translation; Protocols; Relays; Signal to noise ratio; Telecommunication network reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2009. ISIT 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4312-3
  • Electronic_ISBN
    978-1-4244-4313-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2009.5205548
  • Filename
    5205548