Title :
Experimental study and analysis of soft errors in 90nm Xilinx FPGA and beyond
Author :
Lesea, A. ; Castellani-Coulié, K.
Author_Institution :
Xilinx, San Jose, CA, USA
Abstract :
The Xilinx methodology used for soft error test and measurement in FPGAs is exposed. The technology scaling impact on SER from 250 nm down to 65 nm is presented and analyzed by comparing beam and real time testing. Some trends are presented and analyzed.
Keywords :
field programmable gate arrays; Xilinx FPGA; size 90 nm; soft errors; technology scaling; Application specific integrated circuits; Clocks; Error analysis; Field programmable gate arrays; Logic gates; Neutrons; Random access memory; Sea measurements; Silicon; Testing; Beam testing; FPGA; Real time testing; SER; Scaling; Soft Error;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205556
