DocumentCode
2981994
Title
Pyroelectric properties and orthorhombic to rhombohedral electric field induced phase transition in relaxor-ferroelectric single crystals
Author
Davis, M. ; Damjanovic, D. ; Setter, N.
Author_Institution
Laboratory of Ceramics, Swiss Fed. Inst. of Technol., Lausanne, Switzerland
fYear
2004
fDate
23-27 Aug. 2004
Firstpage
205
Lastpage
208
Abstract
The pyroelectric coefficients of 0.72Pb(Mg13/Nb23/)O3-0.28PbTiO3 (PMN-28PT), 0.67Pb(Mg13/Nb23/)O3-0.33PbTiO3 (PMN-33PT) and 0.92Pb(Zn13/Nb23/)O3-0.08PbTiO3 (PZN-8PT) single crystals, oriented and poled along the [001]c, [101]c and [111]c directions (C: pseudocubic) have been measured using a dynamic method. In otherwise pseudoorthorhombic samples of PZN-8PT, a room temperature rhombohedral phase can be stabilized by poling along the [111]c direction at sub zero temperatures. By strain measurement and in situ polarized light microscopy, the corresponding orthorhombic to rhombohedral electric-field induced phase transition has been observed in [111]c-oriented PZN-SPT upon application of a unipolar field. This last result reiterates the universality of the electric field induced phase transition in ferroelectric materials, especially in such crystals near the morphotropic phase boundary where phases are nearly degenerate.
Keywords
dielectric polarisation; ferroelectric transitions; lead compounds; pyroelectricity; relaxor ferroelectrics; PMN-PT; PbMgO3NbO3-PT; ferroelectric materials; in situ polarized light microscopy; morphotropic phase boundary; orthorhombic-rhombohedral electric field induced phase transition; poling; pseudocubic structure; pseudoorthorhombic samples; pyroelectric coefficients; pyroelectric properties; relaxor-ferroelectric single crystals; room temperature rhombohedral phase; strain measurement; Crystalline materials; Crystals; Electrodes; Ferroelectric materials; Indium tin oxide; Microscopy; Niobium; Optical polarization; Pyroelectricity; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2004. ISAF-04. 2004 14th IEEE International Symposium on
ISSN
1099-4734
Print_ISBN
0-7803-8410-5
Type
conf
DOI
10.1109/ISAF.2004.1418372
Filename
1418372
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