DocumentCode :
2982002
Title :
High Performance Carbon Nanotube RF Electronics
Author :
Zhang, Hong ; Payne, Joseph A. ; Pesetski, Aaron A. ; Baumgardner, James E. ; Miller, Wayne ; Krishnaswamy, Krish ; Jazairy, Ali ; Przybysz, John X. ; Adam, J. Douglas
Author_Institution :
Northrop Grumman Electron. Syst., Linthicum, MD
fYear :
2008
fDate :
23-25 June 2008
Firstpage :
13
Lastpage :
14
Abstract :
Carbon nanotubes-based electronic devices have attracted interest for future high performance RF and digital applications because of their potential to operate at high speed while simultaneously dissipating low power. Recent device modeling and measurements conducted at Northrop Grumman predict, due to their unique one- dimensional (1-D) physics, RF carbon nanotube (CNT)-based field effect transistors (FET) are capable of achieving 100 - 1000x higher linearity than current state-of-the-art semiconductor device technology, while maintaining the same dissipated power. Alternatively, this increased linearity for CNT FETs can also be traded to reduce the power dissipation. Low noise amplifiers based on CNT FETs could reduce power dissipation by 20 - 30 dB without sacrificing linearity. Because these performance advantages result from the unique physics of a one-dimensional conducting channel, the channel need obviously be narrow (~3nm or less) which puts a limit on the maximum transconductance of the device. A theoretical maximum transconductance of 155 muS projected for a single CNT FET is insufficient to source a standard impedance load (e.g. 50Omega). To make a device capable of driving a 50Omega load requires a FET made from thousands of CNTs in parallel.
Keywords :
carbon nanotubes; field effect transistors; semiconductor devices; C; RF electronics; carbon nanotube; electronic devices; field effect transistors; semiconductor device; Carbon nanotubes; Current measurement; FETs; Linearity; Nanoscale devices; Physics; Power dissipation; Predictive models; Radio frequency; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2008
Conference_Location :
Santa Barbara, CA
ISSN :
1548-3770
Print_ISBN :
978-1-4244-1942-5
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2008.4800714
Filename :
4800714
Link To Document :
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