• DocumentCode
    2982002
  • Title

    High Performance Carbon Nanotube RF Electronics

  • Author

    Zhang, Hong ; Payne, Joseph A. ; Pesetski, Aaron A. ; Baumgardner, James E. ; Miller, Wayne ; Krishnaswamy, Krish ; Jazairy, Ali ; Przybysz, John X. ; Adam, J. Douglas

  • Author_Institution
    Northrop Grumman Electron. Syst., Linthicum, MD
  • fYear
    2008
  • fDate
    23-25 June 2008
  • Firstpage
    13
  • Lastpage
    14
  • Abstract
    Carbon nanotubes-based electronic devices have attracted interest for future high performance RF and digital applications because of their potential to operate at high speed while simultaneously dissipating low power. Recent device modeling and measurements conducted at Northrop Grumman predict, due to their unique one- dimensional (1-D) physics, RF carbon nanotube (CNT)-based field effect transistors (FET) are capable of achieving 100 - 1000x higher linearity than current state-of-the-art semiconductor device technology, while maintaining the same dissipated power. Alternatively, this increased linearity for CNT FETs can also be traded to reduce the power dissipation. Low noise amplifiers based on CNT FETs could reduce power dissipation by 20 - 30 dB without sacrificing linearity. Because these performance advantages result from the unique physics of a one-dimensional conducting channel, the channel need obviously be narrow (~3nm or less) which puts a limit on the maximum transconductance of the device. A theoretical maximum transconductance of 155 muS projected for a single CNT FET is insufficient to source a standard impedance load (e.g. 50Omega). To make a device capable of driving a 50Omega load requires a FET made from thousands of CNTs in parallel.
  • Keywords
    carbon nanotubes; field effect transistors; semiconductor devices; C; RF electronics; carbon nanotube; electronic devices; field effect transistors; semiconductor device; Carbon nanotubes; Current measurement; FETs; Linearity; Nanoscale devices; Physics; Power dissipation; Predictive models; Radio frequency; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2008
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1942-5
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2008.4800714
  • Filename
    4800714